Hydration Packs for Hiking, Biking, Backpacking
Edited by David Barth, 7 December 2008
from page 76 of the September 29, 2008 issue of Aviation Week & Space
Technology, by David Hughes.
The effects of Radiation on ICs at the time of this writing are as follows:
The electrical charge from natural radiation or that which is associated with an EMP can cause parameters in
devices to shift (e.g. a nominal level of electrical charge), leading to component failures. In addition, electrical
charges can result in “bit-flip,” where a memory element changes states from a logical 0 to a logical 1, or
vice-versa, resulting in erroneous data or logic.